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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-This article introduces the ARM JTAG debugging basic tenets. The basic elements include the TAP (TEST PORT ACCESS) and BOUNDARY - SCAN ARCHITECTURE presentation on this basis, the combined ARM7TDMI details of the principles of JTAG debugging.
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Size: 453358 |
Author: 李易 |
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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-This article introduces the ARM JTAG debugging basic tenets. The basic elements include the TAP (TEST PORT ACCESS) and BOUNDARY - SCA N ARCHITECTURE presentation on this basis, combining ARM7TDMI details of the JTAG Debugging principle.
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Size: 453344 |
Author: fangyy1 |
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Description: wiggler-jtag的protel原理图和PCB图,这个是已经经过实践检验证明能用的了,大家放心去做就是了。 我就是用这个jtag,配合Banyan一起调试arm的,感觉还不错。-wiggler - jtag the Protel schematic and PCB map This has been proved through practice to test a usable, we assure to the grindstone. I used the jtag, Banyan together with the commissioning arm, I feel pretty good.
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Size: 80607 |
Author: xiao |
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Description: jtag边界扫描的经典书籍，内容很详细。是pcb设计人员、芯片设计人员、dft人员必修的内容之一。-Jtag Boundary-Scan Test- A Practical Approach
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Size: 5373389 |
Author: testsb |
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Description: verilog 实现的jtag ip模块
包括了测试程序-Verilog achieve the JTAG ip modules including test procedures
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Size: 6144 |
Author: 陈俊 |
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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-This article introduces the ARM JTAG debugging basic tenets. The basic elements include the TAP (TEST PORT ACCESS) and BOUNDARY- SCAN ARCHITECTURE presentation on this basis, the combined ARM7TDMI details of the principles of JTAG debugging.
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Size: 452608 |
Author: 李易 |
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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-This article introduces the ARM JTAG debugging basic tenets. The basic elements include the TAP (TEST PORT ACCESS) and BOUNDARY- SCAN ARCHITECTURE presentation on this basis, the combined ARM7TDMI details of the principles of JTAG debugging.
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Size: 453632 |
Author: 宋磊 |
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Description: 这个程序是我自己写的，主要用于PXA255的烧写，经过我修改后，特别方便JTAG下，CPU的调试，可以测试CPU的各个IO脚，无需跑操作系统，即可简单查看外设是否正常。参照APP子目录下的使用方法即可。在微软的JflashMM上做了修改。-I wrote it myself, mainly for the PXA255 burning, I have revised, especially convenient JTAG, the CPU test, the CPU can test various IO feet without running the operating system, simple View peripherals can be normal. APP subdirectory under the light of the method can be used. Microsoft has done a JflashMM changes.
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Size: 112640 |
Author: 王成云 |
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Description: 把uCOS移植到三星的44B0的CPU上面，不过是在IAR环境下的，代码是2.80的，还带uCGUI哦，用IAR for ARM 4.31和H-JTAG验证通过。个人认为可以媲美官方版本的移植。-put uCOS transplanted to the 44B0 Samsung CPU above, but in the IAR environment, the code is 2.80, also brings uCGUI Oh, IAR used for the ARM 4.31 and H- JTAG test passed. Individuals that can be comparable to the official version of the transplant.
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Size: 764928 |
Author: 张凡 |
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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-This article introduces the ARM JTAG debugging basic tenets. The basic elements include the TAP (TEST PORT ACCESS) and BOUNDARY- SCA N ARCHITECTURE presentation on this basis, combining ARM7TDMI details of the JTAG Debugging principle.
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Size: 452608 |
Author: fangyy1 |
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Description: wiggler-jtag的protel原理图和PCB图,这个是已经经过实践检验证明能用的了,大家放心去做就是了。 我就是用这个jtag,配合Banyan一起调试arm的,感觉还不错。-wiggler- jtag the Protel schematic and PCB map This has been proved through practice to test a usable, we assure to the grindstone. I used the jtag, Banyan together with the commissioning arm, I feel pretty good.
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Size: 79872 |
Author: xiao |
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Description: 金鹏飞科技-理解边界扫描(boundary scan)JTAG测试.htm-Jinfengfei technology-understood boundary scan (boundary scan) JTAG test. Htm
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Size: 412672 |
Author: 蒋建军 |
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Description: 利用单片机仿真JTAG测试驱动程序,可做测试烧录等-The use of single-chip JTAG emulation test driver, do the test burn, etc.
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Size: 5120 |
Author: rayn |
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Description: 介绍一个芯片边界扫描测试的原理及应用详细文档-Introduced a chip boundary scan test principle and application of detailed documentation
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Size: 344064 |
Author: feixu |
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Description: JTAG是一种所谓的边界扫描技术，即IEEE1149.1。本文将对JTAG的工作原理及打印口工作原理作简要介绍-JTAG is a so-called boundary-scan techniques, namely the IEEE1149.1. In this paper the working principle of JTAG LPT brief working principle
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Size: 34816 |
Author: Tristan |
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Description: ARM核的边界扫描(JTAG)的实现,此代码在s3c2400上测试通过-ARM core boundary scan (JTAG) the realization of this code in the test s3c2400
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Size: 28672 |
Author: wwwwww |
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Description: jtag边界扫描的经典书籍，内容很详细。是pcb设计人员、芯片设计人员、dft人员必修的内容之一。-Jtag Boundary-Scan Test- A Practical Approach
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Size: 5372928 |
Author: david |
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Description: Altera jtag nios测试源代码值得一看，欢迎大家下载-Altera jtag nios test source code worth a visit, welcome you to download
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Size: 7244800 |
Author: LJ |
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Description: AVR JTAG ICE的制作资料，包含原理图、PCB、HEX固件，测试OK-AVR JTAG ICE production data, including schematics, PCB, HEX firmware, test OK
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Size: 184320 |
Author: 翁理祥 |
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Description: 这篇文章主要介绍 ARM JTAG 调试的基本原理。 基本的内容包括了 TAP (TEST ACCESS PORT) 和 BOUNDARY-SCAN ARCHITECTURE 的介绍， 在此基础上， 结合 ARM7TDMI 详细介绍了的 JTAG 调试原理。(OPEN-JTAG Development Group.)
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Size: 462848 |
Author: ZhouGuofei
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